Design Validation and Reliability Assurance of Electronic Systems Using the Next Generation RGT Models.

Abstract

Arrhenius Accelerated Growth Test (AAGT) models is the next generation accelerated testing models used for design validation and reliability assurance of electronics systems. These models are used in design and manufacturing phases towards reliability enhancement of the system respectively. AAGT Models uses Highly Accelerated Stresses for screening of the components towards uncovering product defects as compared to traditional qualification test methods, these models are used to quickly identify design flaws, latent defects, component selection problems, and manufacturing flaws. The procedure includes thermal dwells and rapid temperature changes while subjecting the test unit to increasing degrees of stress. Dynamic stresses (Pseudo-Random Vibration covering all 6DOF systems) and a combination of thermal and dynamic PSD stresses are used towards quickly precipitating inherent/hidden defects. These Accelerated models are used in the research to qualify active array radar modules like Transmit Receive Modules (TRMs) which will be in used in large numbers for modern radar systems, as compared to a traditional approach that will be difficult and time-consuming to filter these modules individually. To increase the quality and dependability of electronic devices, these accelerated life tests models have been extensively adopted. However, extremely accelerated life tests may only be used as a qualitative approach to assess a product’s dependability; they cannot be used to quantify a product’s reliability, such as MTBF/MTTF. Consequently, in order to efficiently assess the level of product reliability while improving product reliability in a timely manner. HALT/HASS uses Arrhenius Accelerated Growth Model that is an effective technique used for screening of the module with in short period. This paper discuss in detail with a case study on active array modules deliberating about the test methodology, challenges faced during Using Arrhenius accelerated test models, rapid testing and assessment of these Four channel TRMs used for airborne Fire Control Radar for combat operations.
Subjects
ELECTRONIC systems; ACCELERATED life testing; RELIABILITY of electronics; MANUFACTURING defects; ELECTRONIC equipment; ELECTRONIC voting

Description